Texas Instruments TMS320DM355 Manual de usuario Pagina 149

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PRODUCT PREVIEW
5.18.1 JTAG Test-Port Electrical Data/Timing
RTCK
TDO
TDI
4
5
TMS
6
7
TCK
1
2
3
TMS320DM355
Digital Media System-on-Chip (DMSoC)
SPRS463A SEPTEMBER 2007 REVISED SEPTEMBER 2007
Table 5-48. Timing Requirements for JTAG Test Port (see Figure 5-51 )
DM355
NO. UNIT
MIN MAX
1 t
c(TCK)
Cycle time, TCK 20 ns
2 tw(TCKH) Pulse duration, TCK high 8 ns
3 tw(TCKL) Pulse duration, TCK low 8 ns
4 t
su(TDIV-RTCKH)
Setup time, TDI valid before RTCK high 10 ns
5 t
h(RTCKH-TDIIV)
Hold time, TDI valid after RTCK high 9 ns
6 t
su(TMSV-RTCKH)
Setup time, TMS valid before RTCK high 2 ns
7 t
h(RTCKH-TMSIV)
Hold time, TMS valid after RTCK high 5 ns
Figure 5-51. JTAG Input Timing
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